featured products

• Terafab Portfolio comprehensive reticle quality control solution
• Aleris ^TM 8500 advanced film thickness and composition system
• Wafersite 2 complete solution for advanced wafer geometry metrology
• TeraScan HR system with high resolution for 45nm reticle inspection

KLA-Tencor enhances new PROLITH 11 lithography optimization product with advanced OPC exploration

We Partner with Our Customers

to develop solutions tailored to their objectives

Results:

• A faster path from data to decisions
• Quicker response to changes in the market
• Reliable, high performences products
• Higher profitability and ROI

That`s the value of working with KLA-Tencor

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